Academic Journal
Mesoscale X-ray diffraction measurement of stress relaxation associated with buckling in compressed thin films
| العنوان: | Mesoscale X-ray diffraction measurement of stress relaxation associated with buckling in compressed thin films |
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| المساهمون: | Padmore, Howard |
| المصدر: | Applied Physics Letters; 83; 1; Other Information: Journal Publication Date: 2003; PBD: 1 Jul 2003 |
| وصف الملف: | Medium: X; Size: vp. |
| URL الوصول: | http://www.osti.gov/scitech/biblio/815420 |
| قاعدة البيانات: | SciTech Connect |
| تدمد: | 00036951 |
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| DOI: | 10.1063/1.1591081 |