Patent
Detector with tunable spectral response
العنوان: | Detector with tunable spectral response |
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Patent Number: | 8,134,141 |
تاريخ النشر: | March 13, 2012 |
Appl. No: | 11/695429 |
Application Filed: | April 02, 2007 |
مستخلص: | A semiconductor detector has a tunable spectral response. These detectors may be used with processing techniques that permit the creation of “synthetic” sensors that have spectral responses that are beyond the spectral responses attainable by the underlying detectors. For example, the processing techniques may permit continuous and independent tuning of both the center wavelength and the spectral resolution of the synthesized spectral response. Other processing techniques can also generate responses that are matched to specific target signatures. |
Inventors: | Krishna, Sanjay (Albuquerque, NM, US); Tyo, J. Scott (Edgwood, NM, US); Hayat, Majeed M. (Albuquerque, NM, US); Raghavan, Sunil (Albuquerque, NM, US); Sakoglu, Unal (Albuquerque, NM, US) |
Assignees: | STC.UNM (Albuquerque, NM, US) |
Claim: | 1. A spectrally tunable detector comprising: a first barrier region disposed on a first conductive region; an absorbing region that is based at least in part on intersubband transitions of quantum states, wherein the absorbing region comprises: a first quantum well region disposed on the first barrier region, a quantum dot region disposed on the first quantum well region, and a second quantum well region disposed on the quantum dot region, wherein the second quantum well region has a different material composition than the first quantum well region, and wherein the different material composition cause a vertical asymmetry in a local potential seen by carriers, a second barrier region positioned on the second quantum well region, wherein the first barrier region and the second barrier region contribute to the vertical in the local potential; and a second conductive region disposed on the second barrier region, wherein both the first conductive region and the second conductive region comprise a highly doped semiconductor material having a same conductivity type. |
Claim: | 2. The spectrally tunable detector of claim 1 , wherein the second quantum well region has a different thickness than the first quantum well region. |
Claim: | 3. The detector of claim 1 wherein a spectral response of the absorbing region peaks at a wavelength greater than 2 μm. |
Claim: | 4. The detector of claim 1 further comprising electrical contacts for applying a bias voltage across the absorbing region, wherein a spectral response of the absorbing region changes as a function of the bias voltage. |
Claim: | 5. The detector of claim 1 wherein the first barrier region comprises a barrier material, the first quantum well region comprises a well material, and a bandgap of the barrier material is higher than a bandgap of the well material. |
Claim: | 6. The detector of claim 1 wherein the first barrier region has a thickness that is a different thickness than the second barrier region. |
Claim: | 7. The detector of claim 1 wherein the first barrier region and the second barrier region comprise AlGaAs. |
Claim: | 8. The detector of claim 7 wherein the first barrier region has an aluminum fraction that is greater than an aluminum fraction of the second barrier region. |
Claim: | 9. A spectrally tunable sensor that can be tuned to synthesize any of a set of target spectral responses, the spectrally tunable sensor comprising: a detector comprising: a first barrier region disposed on a first conductive region; an absorbing region that is based at least in part on intersubband transitions of quantum states, wherein the absorbing region comprises: a first quantum well region disposed on the first barrier region, a quantum dot region disposed on the first quantum well region, and a second quantum well region disposed on the quantum dot region, wherein the second quantum well region has a different material composition than the first quantum well region, and wherein the different material composition cause a vertical asymmetry in a local potential seen by carriers, a second barrier region positioned on the second quantum well region, wherein the first barrier region and the second barrier region contribute to the vertical asymmetry in the local potential; and a second conductive region disposed on the second barrier region, wherein both the first conductive region and the second conductive region comprise a highly doped semiconductor material having a same conductivity type; a controller coupled to the detector that tunes the detector to different basis spectral responses; and a processor coupled to the detector that combines outputs from the detector as tuned to the basis spectral responses in a manner to synthesize a pre-selected target spectral response. |
Claim: | 10. The spectrally tunable sensor of claim 9 wherein the processor makes a weighted combination of the outputs of the detector, the weights determined by projecting the pre-selected target spectral response onto the basis spectral responses of the detector. |
Claim: | 11. The spectrally tunable, sensor of claim 9 wherein, within the set of target spectral responses, a center wavelength of the target spectral response can be continuously varied over a predetermined range and a spectral width of the target spectral response can be continuously varied over a predetermined range. |
Claim: | 12. The spectrally tunable sensor of claim 9 wherein, for at least one of the target spectral responses, the target spectral response is narrower than any of the basis spectral responses of the detector. |
Claim: | 13. The spectrally tunable sensor of claim 9 wherein the processor combines the outputs of the detector in a manner to emulate a hyperspectral sensor. |
Claim: | 14. The spectrally tunable sensor of claim 9 wherein the processor combines the outputs of the detector in a manner to emulate a multispectral sensor. |
Claim: | 15. The spectrally tunable sensor of claim 9 wherein the processor combines the outputs of the detector in a manner to emulate a spectrometer. |
Claim: | 16. A spectrally tunable detector comprising: a first barrier region disposed on a first conductive region; an absorbing region that is based at least in part on intersubband transitions of quantum states, the absorbing region positioned on the first barrier region, wherein the absorbing region comprises: a plurality of sets of regions with each set comprising: a first quantum well region, a quantum dot region disposed on the first quantum well region, and a second quantum well region disposed on the quantum dot region, wherein the second quantum well region has a different material composition than the first quantum well region, and wherein the different material composition cause a vertical asymmetry in a local potential seen by carriers, and a barrier region disposed to separate each set of regions from an adjacent set of regions; a second barrier region positioned on the second quantum well region of the absorbing region, wherein the first barrier region and the second barrier region have different material compositions and the first barrier region and the second barrier region contribute to the vertical asymmetry in the local potential; and a second conductive region disposed on the second barrier region, wherein both the first conductive region and the second conductive region comprise a highly doped semiconductor material having a same conductivity type. |
Current U.S. Class: | 257/21 |
Patent References Cited: | 5291034 March 1994 Allam et al. 5936258 August 1999 Imamura et al. 6239449 May 2001 Fafard et al. 6657195 December 2003 Martin et al. 2005/0017176 January 2005 Koch et al. 2005/0061986 March 2005 Kardynal et al. |
Other References: | Towe et al., “Semiconductor Quantum-Dot . . . Photodetector” IEEE J.of SelectedTopics in Quantum Electronics, vol. 6 No. 3 May/Jun. 2000pp. 408-421. cited by examiner Notification of Transmittal of the International Search Report and the Written Opinion, PCT/US04/31381, Nov. 30, 2005, 7 pages. cited by other Raghavan, S. et al., High-Responsivity, Normal-Incidence Long-Wave Infrared (λ˜7.2 μm) InAs/In0.15Ga0.85As dots-in-a-well detector, Applied Physics Letters, Aug. 19, 2002, pp. 1369-1371, vol. 81, No. 8. cited by other |
Primary Examiner: | Jackson, Jr., Jerome |
Attorney, Agent or Firm: | MH2 Technology Law Group |
رقم الانضمام: | edspgr.08134141 |
قاعدة البيانات: | USPTO Patent Grants |
الوصف غير متاح. |