Electronic Resource

Hexagonal Si and Ge polytypes for silicon photonics

التفاصيل البيبلوغرافية
العنوان: Hexagonal Si and Ge polytypes for silicon photonics
المؤلفون: Scalise, E, Rovaris, F, Marzegalli, A, Emilio Scalise, Fabrizio Rovaris, Anna Marzegalli
بيانات النشر: 2023
نوع الوثيقة: Electronic Resource
مستخلص: The indirect electronic bandgap is the Achille’s heel of Silicon, hindering monolithic integration of lasers for Silicon photonics. Metastable hexagonal polytypes of SiGe are very promising to achieve the direct gap within the Si technology. The main approaches to get these hexagonal polytypes and particularly the hexagonal diamond (2H) phase are discussed. The best quality of 2H Si and Ge has been obtained by exploiting core/shell nanowires [1]: a wurtzite GaAs/P core provides the crystallographic template for the Si/Ge hexagonal shell and together with the lower surface energy of the hexagonal phases allows his epitaxial growth [2]. We will discuss the main problems of this approach from a theoretical perspective, particularly focusing on crystalline defects affecting the hexagonal Si/Ge nanowires (Fig. 1). Then, pressure induced phase transitions in Si and Ge will be presented, focusing on the multiscale modelling of nanoindentation process. In this contest, results obtained with unique methods and novel tools, such as solid-state nudge elastic band (NEB) and machine learning Interatomic potentials, will be also presented [3]. Finally, 2D -hexagonal inclusions in Si and Ge will be discussed. Classically, these would be extended crystalline defects in the cubic phase of Si and Ge, but we will show how these defects could be exploited to form quantum wells with direct gap, potentially very interesting for quantum and optoelectronic applications. [1] E. Fadaly et al., Nano Lett. 2021, 21, 8, 3619–3625. [2] E. Scalise et al., Appl. Surf. Science 2021, 545, 148948. [3] G. Ge et al., ACTA MATERIALIA, 263(15 January 2024) [10.1016/j.actamat.2023.119465]
مصطلحات الفهرس: Hexagonal SiGe, Nanoindentation, DFT, Defects in Si and Ge, info:eu-repo/semantics/conferenceObject
URL: https://hdl.handle.net/10281/452118
15th International Conference on Physics of Advanced Materials (ICPAM-15)
الاتاحة: Open access content. Open access content
info:eu-repo/semantics/openAccess
ملاحظة: English
Other Numbers: ITBAO oai:boa.unimib.it:10281/452118
1415730227
المصدر المساهم: BICOCCA OPEN ARCH
From OAIster®, provided by the OCLC Cooperative.
رقم الانضمام: edsoai.on1415730227
قاعدة البيانات: OAIster