Dissertation/ Thesis
Statistical Analysis of Specific Secondary Circuit Effect under Fault Insertion in 22 nm FD-SOI Technology Node
| العنوان: | Statistical Analysis of Specific Secondary Circuit Effect under Fault Insertion in 22 nm FD-SOI Technology Node |
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| المؤلفون: | McKinsey, Vince Allen |
| بيانات النشر: | The Ohio State University / OhioLINK, 2021. |
| سنة النشر: | 2021 |
| المجموعة: | Ohiolink ETDs |
| Original Material: | http://rave.ohiolink.edu/etdc/view?acc_num=osu1638449463385479 |
| مصطلحات موضوعية: | Electrical Engineering, Signal Activity Rate, SRA, Statistical Analysis, Carry Multiplexed Adder, VHDL, Verilog, Python, Trust Metrics, Testbenchs, FD-SOI, Fully Depleted Silicon-on-Insulator, CMOS, Semiconductor Technology Node, Secondary Circuit Effects, ASIC, ASIC Flow |
| الوصف: | Hardware Trust and Assurance (HT&A) is the study of securing hardware from faults and security threats in much the same way as software security is for software. However, because hardware is, by definition, built using physical components, it is often cost prohibitive to patch out threats and bugs after said hardware is implemented and deployed as such fixes require the physical replacement or modification of said hardware. This paper explores the scope of secondary circuit effects metrics as a use for HT&A, like Switching Rate Activity (SRA) which is explored in this paper. This paper does so by going over the previous use cases of SRA then showing how SRA can be used in a statistical manner to confirm the existence of and locate a fault in a design. The goal of this is to work toward more statisical analysis of secondary circuit effects, like power or netlists. Using Xcelium, Genus, Global Foundries 22nm Fully-Depleted Silicon on Insulator node, a prime number based testbench, and the Carry Multiplexed Adder, it was shown that a statistically measurable difference exists in the SRAs of a design when a fault is introduced. With a p-score of 1.03*10-14 for the means hypothesis test and a p-score of 0.407 for the variance test, the chosen faults did in fact change the behavior of the design when viewed from an SRA lens. In addition, this paper shows that, given the measurable SRA statistical difference of faults and the fact that faults will not propagate their effects all throughout a design when viewed from an SRA perspective, a path exists to find and locate faults from just the SRA effects alone. |
| Original Identifier: | oai:etd.ohiolink.edu:osu1638449463385479 |
| نوع الوثيقة: | Text |
| اللغة: | English |
| الاتاحة: | http://rave.ohiolink.edu/etdc/view?acc_num=osu1638449463385479 |
| Rights: | unrestricted This thesis or dissertation is protected by copyright: all rights reserved. It may not be copied or redistributed beyond the terms of applicable copyright laws. |
| رقم الانضمام: | edsndl.OhioLink.oai.etd.ohiolink.edu.osu1638449463385479 |
| قاعدة البيانات: | Networked Digital Library of Theses & Dissertations |
| الوصف غير متاح. |