Academic Journal

Sensitization Distance and Acid Generation Efficiency in a Model System of Chemically Amplified Electron Beam Resist with Methacrylate Backbone Polymer

التفاصيل البيبلوغرافية
العنوان: Sensitization Distance and Acid Generation Efficiency in a Model System of Chemically Amplified Electron Beam Resist with Methacrylate Backbone Polymer
المؤلفون: Seiichi Tagawa, Takahiro Kozawa, Toshiyuki Kai, Tsutomu Shimokawa
المصدر: Journal of Photopolymer Science and Technology. 2007, 20(4):577
قاعدة البيانات: J-STAGE
الوصف
تدمد:09149244
13496336
DOI:10.2494/photopolymer.20.577