Academic Journal

High frequency modelling approach of on‐chip interconnects considering conductor and substrate skin effects

التفاصيل البيبلوغرافية
العنوان: High frequency modelling approach of on‐chip interconnects considering conductor and substrate skin effects
المؤلفون: Ymeri, H., Nauwelaers, B., Maex, K.
المصدر: Microelectronics International: An International Journal, 2004, Vol. 21, Issue 1, pp. 35-38.
URL الوصول: http://www.emeraldinsight.com/doi/10.1108/13565360410517111
قاعدة البيانات: Emerald Insight
الوصف
تدمد:13565362
DOI:10.1108/13565360410517111