Academic Journal

Cryogenic Characterization of Low-Frequency Noise in 40-nm CMOS

التفاصيل البيبلوغرافية
العنوان: Cryogenic Characterization of Low-Frequency Noise in 40-nm CMOS
المؤلفون: Gerd Kiene, Sadik Ilik, Luigi Mastrodomenico, Masoud Babaie, Fabio Sebastiano
المصدر: IEEE Journal of the Electron Devices Society, Vol 12, Pp 573-580 (2024)
بيانات النشر: IEEE, 2024.
سنة النشر: 2024
المجموعة: LCC:Electrical engineering. Electronics. Nuclear engineering
مصطلحات موضوعية: Low frequency noise, 1/f noise, flicker noise, cryogenic electronics, Cryo-CMOS, quantum computing, Electrical engineering. Electronics. Nuclear engineering, TK1-9971
الوصف: This paper presents an extensive characterization of the low-frequency noise (LFN) at room temperature (RT) and cryogenic temperature (4.2K) of 40-nm bulk-CMOS transistors. The noise is measured over a wide range of bias conditions and geometries to generate a comprehensive overview of LFN in this technology. While the RT results are in-line with the literature and the foundry models, the cryogenic behavior diverges in many aspects. These deviations include changes with respect to RT in magnitude and bias dependence that are conditional on transistor type and geometry, and even an additional systematic Lorentzian feature that is common among individual devices. Furthermore, we find the scaling of the average LFN with the area and its variability to be similar between RT and 4.2K, with the cryogenic scaling reported systematically for the first time. The findings suggest that, as no consistent decrease of LFN at lower temperatures is observed while the white noise is reduced, the impact of LFN for precision analog design at cryogenic temperatures gains a more predominant role.
نوع الوثيقة: article
وصف الملف: electronic resource
اللغة: English
تدمد: 2168-6734
Relation: https://ieeexplore.ieee.org/document/10606256/; https://doaj.org/toc/2168-6734
DOI: 10.1109/JEDS.2024.3432283
URL الوصول: https://doaj.org/article/b4fd5fdbd1fb42b08a36c5ff6d9b2f2e
رقم الانضمام: edsdoj.b4fd5fdbd1fb42b08a36c5ff6d9b2f2e
قاعدة البيانات: Directory of Open Access Journals
الوصف
تدمد:21686734
DOI:10.1109/JEDS.2024.3432283