Academic Journal

Sensitivity Distribution of CCERT Sensor Under Different Excitation Patterns

التفاصيل البيبلوغرافية
العنوان: Sensitivity Distribution of CCERT Sensor Under Different Excitation Patterns
المؤلفون: Zhen Xu, Yandan Jiang, Baoliang Wang, Zhiyao Huang, Haifeng Ji, Haiqing Li
المصدر: IEEE Access, Vol 5, Pp 14830-14836 (2017)
بيانات النشر: IEEE, 2017.
سنة النشر: 2017
المجموعة: LCC:Electrical engineering. Electronics. Nuclear engineering
مصطلحات موضوعية: Process tomography, electrical tomography, capacitively coupled electrical resistance tomography (CCERT), excitation pattern, sensitivity distribution, Electrical engineering. Electronics. Nuclear engineering, TK1-9971
الوصف: This paper focuses on the study of sensitivity distribution of the capacitively coupled electrical resistance tomography (CCERT) and the influences of excitation patterns on sensitivity distributions. The sensitivity distributions of a 12-electrode CCERT sensor under three excitation patterns (the one-electrode excitation pattern, the three-electrode excitation pattern, and the five-electrode excitation pattern) are investigated and compared. The simulation study was implemented by the COMSOL Multiphysics FEM simulation software and MATLAB. The research results show that there is no negative region in the sensitivity distributions of the CCERT sensor and all the sensitivity distributions are not uniform. The research results also indicate that as the number of excitation electrodes increases, the sensitivity distributions have higher average sensitivity and better distribution uniformity.
نوع الوثيقة: article
وصف الملف: electronic resource
اللغة: English
تدمد: 2169-3536
Relation: https://ieeexplore.ieee.org/document/7945333/; https://doaj.org/toc/2169-3536
DOI: 10.1109/ACCESS.2017.2713834
URL الوصول: https://doaj.org/article/77ee509f5c4d4712a41301c0a7d70d10
رقم الانضمام: edsdoj.77ee509f5c4d4712a41301c0a7d70d10
قاعدة البيانات: Directory of Open Access Journals
الوصف
تدمد:21693536
DOI:10.1109/ACCESS.2017.2713834