Academic Journal

AgIn2 thickness on void rate, microstructure, IMC growth, thermal and mechanical properties of fluxless In@AgIn2 joint

التفاصيل البيبلوغرافية
العنوان: AgIn2 thickness on void rate, microstructure, IMC growth, thermal and mechanical properties of fluxless In@AgIn2 joint
المؤلفون: Jing Wen, Guoliao Sun, Jinyang Su, Yi Fan, Linzheng Fu, Zhuo Chen, Wenhui Zhu
المصدر: Journal of Materials Research and Technology, Vol 35, Iss , Pp 1072-1089 (2025)
بيانات النشر: Elsevier, 2025.
سنة النشر: 2025
المجموعة: LCC:Mining engineering. Metallurgy
مصطلحات موضوعية: Indium thermal interface materials, AgIn2 thickness, Fluxless, Low void rate, Heat dissipation, BGA, Mining engineering. Metallurgy, TN1-997
الوصف: Indium (In) has been extensively used as a thermal interface material (TIM1) between the die and lid in high-power central processing units (CPUs) to enhance heat dissipation. However, organic flux residues trapped within the In solder during indium reflow process can outgas during subsequent solder ball reflow cycles, leading to the formation of significant voids (up to 35% void fraction) in the In TIM1. This issue limits the application of In in advanced ball grid array (BGA) packages. In this study, for the first time, varying thicknesses Ag coatings were electroplated onto the surfaces of thick In TIM1 to form a non-oxidizing AgIn2 layer (In@xAgIn2, where x = 0.4, 1, 3, 6 μm) to protects the inner In from oxidation and enables fluxless reflow. Joints prepared with In or In@xAgIn2 underwent indium reflow and three solder ball reflow cycles to simulate the reflow processes typical of BGA packages. A clear AgIn2 thickness effect on solder wettability, microstructure, intermetallic compound (IMC) growth, joint thermal and mechanical properties were found. The results showed that In@0.4AgIn₂; had a contact angle of 26.2°, which was 2.6° lower than that of pure In solder. Joints prepared with In@0.4AgIn₂; also exhibited the lowest void fraction (≤2%), which contributed to better heat dissipation. During reflow, the Ag atoms from the AgIn2 protective layer altered the morphology and reduced the thickness of the Ni3In7 IMC layer. After reflow, the Ag atoms either solubilized in In or formed AgIn2 IMC with distinct distribution characteristics in the solder layer, which increased the shear strength of the joints by 81.5%. The fracture mode of the joints also changed from ductile to ductile-brittle, and ultimately to brittle.
نوع الوثيقة: article
وصف الملف: electronic resource
اللغة: English
تدمد: 2238-7854
Relation: http://www.sciencedirect.com/science/article/pii/S2238785425000985; https://doaj.org/toc/2238-7854
DOI: 10.1016/j.jmrt.2025.01.098
URL الوصول: https://doaj.org/article/36b17d1301ef4caf81bfbcfceee07a00
رقم الانضمام: edsdoj.36b17d1301ef4caf81bfbcfceee07a00
قاعدة البيانات: Directory of Open Access Journals
الوصف
تدمد:22387854
DOI:10.1016/j.jmrt.2025.01.098