التفاصيل البيبلوغرافية
| العنوان: |
Tracking Hydrogen During Poly-Si/SiOx Contact Fabrication: An Infrared Spectroscopy Analysis of Si–H Bonds Configurations |
| المؤلفون: |
Vincent Bocquet, Raphaël Cabal, Mickaël Albaric, Nevine Rochat, Raphaël Ramos, Jean-Paul Barnes, Sébastien Dubois |
| المصدر: |
SiliconPV Conference Proceedings, Vol 1 (2024) |
| بيانات النشر: |
TIB Open Publishing, 2024. |
| سنة النشر: |
2024 |
| المجموعة: |
LCC:Renewable energy sources |
| مصطلحات موضوعية: |
Silicon Solar Cells, Poly-Silicon, Hydrogen, TOPCon, FTIR, Renewable energy sources, TJ807-830 |
| الوصف: |
The hydrogenation step contributing to the high efficiencies (>25%) reached with poly-Si/SiOx passivated contacts solar cells is still poorly understood. In this study, Fourier transform infrared spectroscopy (FTIR) is used to follow the different bonding configurations of H during the fabrication process. The carrier lifetime degradation upon annealing is correlated to an important loss of Si–H bonds, from both the a‑Si:H film and the SiOx interfaces. The subsequent hydrogenation step results in the formation of a small number of Si–H bonds near the crystalline silicon c-Si/SiOx interface, associated with the low stretching mode (LSM) and correlated to a significant lifetime improvement. These bonds feature a preferential orientation, as shown by polarized measurements. |
| نوع الوثيقة: |
article |
| وصف الملف: |
electronic resource |
| اللغة: |
English |
| تدمد: |
2940-2123 |
| Relation: |
https://www.tib-op.org/ojs/index.php/siliconpv/article/view/847; https://doaj.org/toc/2940-2123 |
| DOI: |
10.52825/siliconpv.v1i.847 |
| URL الوصول: |
https://doaj.org/article/a0d32333bb0745539e82a51d68cc379b |
| رقم الانضمام: |
edsdoj.0d32333bb0745539e82a51d68cc379b |
| قاعدة البيانات: |
Directory of Open Access Journals |