Academic Journal
Cost Efficient Flip-Flop Designs With Multiple-Node Upset-Tolerance and Algorithm-Based Verifications
| العنوان: | Cost Efficient Flip-Flop Designs With Multiple-Node Upset-Tolerance and Algorithm-Based Verifications |
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| المؤلفون: | Yan, Aibin, He, Yuting, Huang, Zhengfeng, Yan, Wenjie, Cui, Jie, Wang, Xiaolei, Ni, Tianming, Girard, Patrick, Wen, Xiaoqing |
| المساهمون: | Hefei University of Technology (HFUT), Guangdong University of Technology, Anhui University Hefei, Anhui Polytechnic University, Test and dEpendability of microelectronic integrated SysTems (LIRMM, Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier (LIRMM), Centre National de la Recherche Scientifique (CNRS)-Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS)-Université de Montpellier (UM), Kyushu Institute of Technology (Kyutech) |
| المصدر: | ISSN: 0278-0070 ; IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-04737573 ; IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2024, In press. ⟨10.1109/TCAD.2024.3426271⟩. |
| بيانات النشر: | HAL CCSD IEEE |
| سنة النشر: | 2024 |
| المجموعة: | Université de Montpellier: HAL |
| مصطلحات موضوعية: | Flip-Flop, Verification algorithm, C-element, Radiation hardness, Multiple-node-upset, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics |
| الوصف: | International audience ; This paper presents radiation-hardened flip-flop (FF) designs capable of tolerating soft errors, e.g., single-node upsets (SNUs), double-node upsets (DNUs) and multiple-node upsets (MNUs). First, a 2-input FF and a 3-input FF are proposed as the baseline FFs that not only respectively tolerate SNUs and DNUs but also exhibit cost efficiency in terms of delay, power, and area. Through adding two stages of C-elements, a 4-input FF and a 5-input FF are proposed as the baseline FFs as well. Utilizing the structural characteristics of these FFs, an N-1 input FF and an N input FF are proposed as the extended FFs capable of tolerating more node upsets. Moreover, a highly efficient algorithm for verifying MNU-tolerance of these FFs is proposed. Algorithm and HSPICE-tool-based verification results both demonstrate the MNU-tolerance for the proposed FFs with more inputs. |
| نوع الوثيقة: | article in journal/newspaper |
| اللغة: | English |
| DOI: | 10.1109/TCAD.2024.3426271 |
| الاتاحة: | https://hal-lirmm.ccsd.cnrs.fr/lirmm-04737573 https://hal-lirmm.ccsd.cnrs.fr/lirmm-04737573v1/document https://hal-lirmm.ccsd.cnrs.fr/lirmm-04737573v1/file/TCAD-FF-early%20access.pdf https://doi.org/10.1109/TCAD.2024.3426271 |
| Rights: | info:eu-repo/semantics/OpenAccess |
| رقم الانضمام: | edsbas.FF99B020 |
| قاعدة البيانات: | BASE |
| DOI: | 10.1109/TCAD.2024.3426271 |
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