Conference
Design and validation of a platform for electromagnetic fault injection
| العنوان: | Design and validation of a platform for electromagnetic fault injection |
|---|---|
| المؤلفون: | Balasch, Josep, Arumi Delgado, Daniel, Manich Bou, Salvador |
| المساهمون: | Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica, Universitat Politècnica de Catalunya. QINE - Disseny de Baix Consum, Test, Verificació i Circuits Integrats de Seguretat |
| بيانات النشر: | Institute of Electrical and Electronics Engineers (IEEE) |
| سنة النشر: | 2018 |
| المجموعة: | Universitat Politècnica de Catalunya (UPC): Tesis Doctorals en Xarxa (TDX) / Theses and Dissertations Online |
| مصطلحات موضوعية: | Àrees temàtiques de la UPC::Enginyeria electrònica, Integrated circuits, Electromagnetic interference, Circuit faults, Probes, Security, Electromagnetics, Pulse generation, Capacitors, Circuits integrats, Interferència electromagnètica |
| الوصف: | Security is acknowledged as one of the main challenges in the design and deployment of embedded circuits. Devices need to operate on-the-field safely and correctly, even when at physical reach of potential adversaries. One of the most powerful techniques to compromise the correct functioning of a device are fault injection attacks. They enable an active adversary to trigger errors on a circuit in order to bypass security features or to gain knowledge of security-sensitive information. There are several methods to induce such errors. In this work we focus on the injection of faults through the electromagnetic (EM) channel. In particular, we document our efforts towards building a suitable platform for EM pulse injection. We design a pulse injection circuit that can provide currents over 20 A to an EM injector in order to generate abrupt variations of the EM field on the vicinity of a circuit. We validate the suitability of our platform by applying a well-know attack on an embedded 8-bit microcontroller implementing the AES block cipher. In particular, we show how to extract the AES secret cryptographic keys stored in the device by careful injection of faults during the encryption operations and simple analysis of the erroneous outputs. ; Peer Reviewed ; Postprint (published version) |
| نوع الوثيقة: | conference object |
| وصف الملف: | 6 p. |
| اللغة: | English |
| ردمك: | 978-1-5386-5108-7 1-5386-5108-4 |
| Relation: | http://ieeexplore.ieee.org/document/8311630/; Balasch, J., Arumi, D., Manich, S. Design and validation of a platform for electromagnetic fault injection. A: Conference on Design of Circuits and Integrated Systems. "Design of Circuits and Integrated Systems (DCIS), 2017 32nd Conference on". Institute of Electrical and Electronics Engineers (IEEE), 2018, p. 1-6.; http://hdl.handle.net/2117/116688 |
| DOI: | 10.1109/DCIS.2017.8311630 |
| الاتاحة: | http://hdl.handle.net/2117/116688 https://doi.org/10.1109/DCIS.2017.8311630 |
| Rights: | Attribution-NonCommercial-NoDerivs 3.0 Spain ; http://creativecommons.org/licenses/by-nc-nd/3.0/es/ ; Open Access |
| رقم الانضمام: | edsbas.FE9E896B |
| قاعدة البيانات: | BASE |
| ردمك: | 9781538651087 1538651084 |
|---|---|
| DOI: | 10.1109/DCIS.2017.8311630 |