Academic Journal
Impact of High-k Gate Dielectric on Self-Heating Effects in PiFETs Structure
| العنوان: | Impact of High-k Gate Dielectric on Self-Heating Effects in PiFETs Structure |
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| المؤلفون: | Belkhiria, Maissa, Echouchene, Fraj, Jaba, Nejeh, Bajahzar, Abdullah, Belmabrouk, Hafedh |
| المصدر: | IEEE Transactions on Electron Devices ; volume 67, issue 9, page 3522-3529 ; ISSN 0018-9383 1557-9646 |
| بيانات النشر: | Institute of Electrical and Electronics Engineers (IEEE) |
| سنة النشر: | 2020 |
| نوع الوثيقة: | article in journal/newspaper |
| اللغة: | unknown |
| DOI: | 10.1109/ted.2020.3012418 |
| الاتاحة: | https://doi.org/10.1109/ted.2020.3012418 http://xplorestaging.ieee.org/ielx7/16/9172152/09163173.pdf?arnumber=9163173 |
| Rights: | https://ieeexplore.ieee.org/Xplorehelp/downloads/license-information/IEEE.html ; https://doi.org/10.15223/policy-029 ; https://doi.org/10.15223/policy-037 |
| رقم الانضمام: | edsbas.F62BB4C9 |
| قاعدة البيانات: | BASE |
| DOI: | 10.1109/ted.2020.3012418 |
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