Academic Journal
From Sample Poverty to Rich Feature Learning: A New Metric Learning Method for Few-Shot Classification
| العنوان: | From Sample Poverty to Rich Feature Learning: A New Metric Learning Method for Few-Shot Classification |
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| المؤلفون: | Zhang, Lei, Lin, Yiting, Yang, Xinyu, Chen, Tingting, Cheng, Xiyuan, Cheng, Wenbin |
| المساهمون: | National Natural Science Foundation of China, Science and Technology Foundation of Guangdong Province, Guangdong Basic and Applied Basic Research Foundation |
| المصدر: | IEEE Access ; volume 12, page 124990-125002 ; ISSN 2169-3536 |
| بيانات النشر: | Institute of Electrical and Electronics Engineers (IEEE) |
| سنة النشر: | 2024 |
| نوع الوثيقة: | article in journal/newspaper |
| اللغة: | unknown |
| DOI: | 10.1109/access.2024.3444483 |
| الاتاحة: | http://dx.doi.org/10.1109/access.2024.3444483 http://xplorestaging.ieee.org/ielx8/6287639/10380310/10637391.pdf?arnumber=10637391 |
| Rights: | https://creativecommons.org/licenses/by-nc-nd/4.0/ |
| رقم الانضمام: | edsbas.F2AEE34A |
| قاعدة البيانات: | BASE |
| DOI: | 10.1109/access.2024.3444483 |
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