التفاصيل البيبلوغرافية
| العنوان: |
Nanoscale density fluctuations in swift heavy ion irradiated amorphous SiO2 |
| المؤلفون: |
Kluth, Patrick, Pakarinen, O. H., Djurabekova, F., Giulian, Raquel, Ridgway, M.C., Byrne, A. P., Nordlund, K. |
| سنة النشر: |
2011 |
| المجموعة: |
Universidade Federal do Rio Grande do Sul (UFRGS): Lume |
| مصطلحات موضوعية: |
Física da matéria condensada, Semicondutores amorfos, Efeitos de feixe iônico, Dinâmica molecular, Sincrotrons, Compostos de silício, Ouro |
| الوصف: |
We report on the observation of nanoscale density fluctuations in 2 μm thick amorphous SiO2 layers irradiated with 185 MeV Au ions. At high fluences, in excess of approximately 5 1012 ions=cm², where the surface is completely covered by ion tracks, synchrotron small angle x-ray scattering measurements reveal the existence of a steady state of density fluctuations. In agreement with molecular dynamics simulations, this steady state is consistent with an ion track “annihilation” process, where high-density regions generated in the periphery of new tracks fill in low-density regions located at the center of existing tracks. |
| نوع الوثيقة: |
article in journal/newspaper |
| وصف الملف: |
application/pdf |
| اللغة: |
English |
| تدمد: |
0021-8979 |
| Relation: |
Journal of applied physics. Vol. 110, no. 12 (Dec. 2011), 123520, 5 p.; http://hdl.handle.net/10183/206613; 000829563 |
| الاتاحة: |
http://hdl.handle.net/10183/206613 |
| Rights: |
Open Access |
| رقم الانضمام: |
edsbas.E4B37261 |
| قاعدة البيانات: |
BASE |