Academic Journal

Electron glass effects in amorphous NbSi films

التفاصيل البيبلوغرافية
العنوان: Electron glass effects in amorphous NbSi films
المؤلفون: Delahaye, Julien, Grenet, T, Marrache-Kikuchi, Claire, A, Humbert, Vincent, Bergé, Laurent, Dumoulin, Louis
المساهمون: Magnétisme et Supraconductivité (NEEL - MagSup), Institut Néel (NEEL), Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes (UGA)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP), Université Grenoble Alpes (UGA)-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes (UGA)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP), Université Grenoble Alpes (UGA), Université Paris-Sud - Paris 11 (UP11)
المصدر: ISSN: 2542-4653 ; SciPost Physics ; https://hal.science/hal-02945691 ; SciPost Physics, 2020, 8 (4), pp.056. ⟨10.21468/SciPostPhys.8.4.056⟩.
بيانات النشر: CCSD
SciPost Foundation
سنة النشر: 2020
مصطلحات موضوعية: [PHYS]Physics [physics]
الوصف: International audience ; We report on non equilibrium field effect in insulating amorphous NbSi thin films having different Nb contents and thicknesses. The hallmark of an electron glass, namely the logarithmic growth of a memory dip in conductance versus gate voltage curves, is observed in all the films after a cooling from room temperature to 4.2 K. A very rich phenomenology is demonstrated. While the memory dip width is found to strongly vary with the film parameters, as was also observed in amorphous indium oxide films, screening lengths and temperature dependence of the dynamics are closer to what is observed in granular Al films. Our results demonstrate that the differentiation between continuous and discontinuous systems is not relevant to understand the discrepancies reported between various systems in the electron glass features. We suggest instead that they are not of fundamental nature and stem from differences in the protocols used and in the electrical inhomogeneity length scales within each material.
نوع الوثيقة: article in journal/newspaper
اللغة: English
Relation: info:eu-repo/semantics/altIdentifier/arxiv/2001.01437; ARXIV: 2001.01437
DOI: 10.21468/SciPostPhys.8.4.056
الاتاحة: https://hal.science/hal-02945691
https://hal.science/hal-02945691v1/document
https://hal.science/hal-02945691v1/file/DelahayeNbSiv16.pdf
https://doi.org/10.21468/SciPostPhys.8.4.056
Rights: info:eu-repo/semantics/OpenAccess
رقم الانضمام: edsbas.E3444C5F
قاعدة البيانات: BASE
الوصف
DOI:10.21468/SciPostPhys.8.4.056