Conference
Fast and efficient approach to predict EMC immunity of complex equipment after a component change
| العنوان: | Fast and efficient approach to predict EMC immunity of complex equipment after a component change |
|---|---|
| المؤلفون: | Chetouani, Saliha, Serpaud, Sébastien, Boyer, Alexandre, Ben Dhia, Sonia |
| المساهمون: | Équipe Énergie et Systèmes Embarqués (LAAS-ESE), Laboratoire d'analyse et d'architecture des systèmes (LAAS), Université Toulouse Capitole (UT Capitole), Université de Toulouse (UT)-Université de Toulouse (UT)-Institut National des Sciences Appliquées - Toulouse (INSA Toulouse), Institut National des Sciences Appliquées (INSA)-Université de Toulouse (UT)-Institut National des Sciences Appliquées (INSA)-Université Toulouse - Jean Jaurès (UT2J), Université de Toulouse (UT)-Université Toulouse III - Paul Sabatier (UT3), Université de Toulouse (UT)-Centre National de la Recherche Scientifique (CNRS)-Institut National Polytechnique (Toulouse) (Toulouse INP), Université de Toulouse (UT)-Université Toulouse Capitole (UT Capitole), Université de Toulouse (UT), IRT Saint Exupéry - Institut de Recherche Technologique, Projet IRT Saint-Exupéry FELINE |
| المصدر: | EMC Europe 2020 ; https://laas.hal.science/hal-02951845 ; EMC Europe 2020, Sep 2020, Rome (online), Italy |
| بيانات النشر: | HAL CCSD |
| سنة النشر: | 2020 |
| المجموعة: | Université Toulouse III - Paul Sabatier: HAL-UPS |
| مصطلحات موضوعية: | Obsolescence, Conducted immunity, Multiport, S- Parameters, Indirect measurement, De-embedding, [SPI.TRON]Engineering Sciences [physics]/Electronics, [SPI.ELEC]Engineering Sciences [physics]/Electromagnetism |
| جغرافية الموضوع: | Rome (online), Italy |
| الوصف: | International audience ; This paper describes a fast methodology for managing the obsolescence issues of components in industrial equipment (aeronautical and/or automotive). The objective is to predict Electromagnetic Compatibility (EMC) non-compliance risk or guarantee a non-regression of EMC performances, in conducted immunity, after a component change. This could be achieved through an equivalent test at the component level if the residual voltage at its pins could be estimated. Accordingly, this approach aims to decline conducted immunity requirements, from the connector at the input of an equipment to an obsolete component placed on one of its boards. Which must constitute a faster and cheaper solution than systematic EMC qualification test of the equipment each time a component is replaced. |
| نوع الوثيقة: | conference object |
| اللغة: | English |
| Relation: | hal-02951845; https://laas.hal.science/hal-02951845; https://laas.hal.science/hal-02951845/document; https://laas.hal.science/hal-02951845/file/CHETOUANI_EMC_Europe2020_VF2_aout2020.pdf |
| الاتاحة: | https://laas.hal.science/hal-02951845 https://laas.hal.science/hal-02951845/document https://laas.hal.science/hal-02951845/file/CHETOUANI_EMC_Europe2020_VF2_aout2020.pdf |
| Rights: | info:eu-repo/semantics/OpenAccess |
| رقم الانضمام: | edsbas.E3059BC7 |
| قاعدة البيانات: | BASE |
| الوصف غير متاح. |