Academic Journal

Fluorinated Graphene Contacts and Passivation Layer for MoS2 Field Effect Transistors

التفاصيل البيبلوغرافية
العنوان: Fluorinated Graphene Contacts and Passivation Layer for MoS2 Field Effect Transistors
المؤلفون: Ryu, Huije, Kim, Dong-Hyun, Kwon, Junyoung, Park, Sang Kyu, Lee, Wanggon, Seo, Hyungtak, Watanabe, Kenji, Taniguchi, Takashi, Kim, SunPhil, van der Zande, Arend M., Son, Jangyup, Lee, Gwan-Hyoung
المساهمون: Lee, Gwan-Hyoung
بيانات النشر: Wiley-VCH Verlag
سنة النشر: 2022
المجموعة: Seoul National University: S-Space
مصطلحات موضوعية: 2D materials heterostructure, electrical passivation, fluorination, graphene, MoS 2
الوصف: © 2022 The Authors. Advanced Electronic Materials published by Wiley-VCH GmbHRealizing a future of 2D semiconductor-based devices requires new approaches to channel passivation and nondestructive contact engineering. Here, a facile one-step technique is shown that simultaneously utilizes monolayer fluorinated graphene (FG) as the passivation layer and contact buffer layer to 2D semiconductor transistors. Monolayer graphene is transferred onto the MoS2, followed by fluorination by XeF2 gas exposure. Metal electrodes for source and drain are fabricated on top of FG-covered MoS2 regions. The MoS2 transistor is perfectly passivated by insulating FG layer and, in the contacts, FG layer also acts as an efficient charge injection layer, leading to the formation of Ohmic contacts and high carrier mobility of up to 64 cm2 V−1 s−1 at room temperature. This work shows a novel strategy for simultaneous fabrication of passivation layer and low-resistance contacts by using ultrathin functionalized graphene, which has applications for high performance 2D semiconductor integrated electronics. ; Y ; 1
نوع الوثيقة: article in journal/newspaper
اللغة: unknown
ردمك: 978-0-00-766451-1
0-00-766451-6
تدمد: 2199-160X
Relation: Advanced Electronic Materials, Vol.8 No.10, p. 2101370; https://hdl.handle.net/10371/184018; 000766451600001; 2-s2.0-85126059219; 160605
DOI: 10.1002/aelm.202101370
الاتاحة: https://hdl.handle.net/10371/184018
https://doi.org/10.1002/aelm.202101370
رقم الانضمام: edsbas.E15BED10
قاعدة البيانات: BASE
الوصف
ردمك:9780007664511
0007664516
تدمد:2199160X
DOI:10.1002/aelm.202101370