Conference
The effect of dielectric stress on the electrical characteristics of AlGaN/GaN heterostructure field-effect transistors (HFETs)
| العنوان: | The effect of dielectric stress on the electrical characteristics of AlGaN/GaN heterostructure field-effect transistors (HFETs) |
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| المؤلفون: | Tan, W.S., Hill, G., Houston, P.A., Low, M.W., Parbrook, P.J., Airey, R.J. |
| المصدر: | The 10th IEEE International Symposium on Electron Devices for Microwave and Optoelectronic Applications ; page 130-135 |
| بيانات النشر: | IEEE |
| سنة النشر: | 2003 |
| نوع الوثيقة: | conference object |
| اللغة: | unknown |
| DOI: | 10.1109/edmo.2002.1174943 |
| الاتاحة: | http://dx.doi.org/10.1109/edmo.2002.1174943 http://xplorestaging.ieee.org/ielx5/8328/25995/01174943.pdf?arnumber=1174943 |
| رقم الانضمام: | edsbas.E0562AEC |
| قاعدة البيانات: | BASE |
| DOI: | 10.1109/edmo.2002.1174943 |
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