Conference
Back Barrier Trapping Induced Resistance Dispersion in GaN HEMT: Mechanism, Modeling, and Solutions
| العنوان: | Back Barrier Trapping Induced Resistance Dispersion in GaN HEMT: Mechanism, Modeling, and Solutions |
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| المؤلفون: | Yu, Hao, Parvais, B., Peralagu, U., ElKashlan, R. Y., Rodriguez, R., Khaled, A., Yadav, S., Alian, A., Zhao, M., De Almeida Braga, N., Cobb, J., Fang, J., Cardinael, P., Sibaja-Hernandez, A., Collaert, N. |
| المصدر: | 2022 International Electron Devices Meeting (IEDM) |
| بيانات النشر: | IEEE |
| سنة النشر: | 2022 |
| نوع الوثيقة: | conference object |
| اللغة: | unknown |
| DOI: | 10.1109/iedm45625.2022.10019489 |
| الاتاحة: | http://dx.doi.org/10.1109/iedm45625.2022.10019489 http://xplorestaging.ieee.org/ielx7/10019319/10019320/10019489.pdf?arnumber=10019489 |
| Rights: | https://doi.org/10.15223/policy-029 ; https://doi.org/10.15223/policy-037 |
| رقم الانضمام: | edsbas.DA199FB1 |
| قاعدة البيانات: | BASE |
| DOI: | 10.1109/iedm45625.2022.10019489 |
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