التفاصيل البيبلوغرافية
| العنوان: |
A Reliability Overview of Intel’s 10+ Logic Technology |
| المؤلفون: |
Grover, R., Acosta, T., AnDyke, C., Armagan, E., Auth, C., Chugh, S., Downes, K., Hattendorf, M., Jack, N., Joshi, S., Kasim, R., Leatherman, G., Lee, S.-H., Lin, C.-Y., Madhavan, A., Mao, H., Lowrie, A., Martin, G., McPherson, G., Nayak, P., Neale, A., Nminibapiel, D., Orr, B., Palmer, J., Pelto, C., Poon, S. S., Post, I., Pramanik, T., Rahman, A., Ramey, S., Seifert, N., Sethi, K., Schmitz, A., Wu, H., Yeoh, A. |
| المصدر: |
2020 IEEE International Reliability Physics Symposium (IRPS) |
| بيانات النشر: |
IEEE |
| سنة النشر: |
2020 |
| نوع الوثيقة: |
conference object |
| اللغة: |
unknown |
| DOI: |
10.1109/irps45951.2020.9128345 |
| الاتاحة: |
http://dx.doi.org/10.1109/irps45951.2020.9128345
http://xplorestaging.ieee.org/ielx7/9125439/9128217/09128345.pdf?arnumber=9128345 |
| Rights: |
https://ieeexplore.ieee.org/Xplorehelp/downloads/license-information/IEEE.html ; https://doi.org/10.15223/policy-029 ; https://doi.org/10.15223/policy-037 |
| رقم الانضمام: |
edsbas.D3B65FDE |
| قاعدة البيانات: |
BASE |