Characterization and Optimization of Single Wafer Processing Equipment with Advanced Aqueous Formulations to Achieve Lower Cost of Ownership for Advanced Cu Interconnect Cleaning Processes

التفاصيل البيبلوغرافية
العنوان: Characterization and Optimization of Single Wafer Processing Equipment with Advanced Aqueous Formulations to Achieve Lower Cost of Ownership for Advanced Cu Interconnect Cleaning Processes
المؤلفون: Kirk, Simon, Tse, Chiu, Wang, Eric, Wu, Cooper, Wong, Sang Min, Henry, Sally Ann, Archer, Leo, West, Jason, Cakmak, Erkan
المصدر: 2008 IEEE/SEMI Advanced Semiconductor Manufacturing Conference ; page 228-232 ; ISSN 1078-8743
بيانات النشر: IEEE
سنة النشر: 2008
نوع الوثيقة: conference object
اللغة: unknown
DOI: 10.1109/asmc.2008.4529043
الاتاحة: http://dx.doi.org/10.1109/asmc.2008.4529043
http://xplorestaging.ieee.org/ielx5/4519622/4528988/04529043.pdf?arnumber=4529043
رقم الانضمام: edsbas.CBA9D1E8
قاعدة البيانات: BASE
الوصف
DOI:10.1109/asmc.2008.4529043