Academic Journal

Piezoelectric measurements with atomic force microscopy

التفاصيل البيبلوغرافية
العنوان: Piezoelectric measurements with atomic force microscopy
المؤلفون: Christman, J. A., Woolcott, R. R., Kingon, A. I., Nemanich, R. J.
المصدر: Applied Physics Letters ; volume 73, issue 26, page 3851-3853 ; ISSN 0003-6951 1077-3118
بيانات النشر: AIP Publishing
سنة النشر: 1998
الوصف: An atomic force microscope (AFM) is used to measure the magnitude of the effective longitudinal piezoelectric constant (d33) of thin films. Measurements are performed with a conducting diamond AFM tip in contact with a top electrode. The interaction between the tip and electric field present is a potentially large source of error that is eliminated through the use of this configuration and the conducting diamond tips. Measurements yielded reasonable piezoelectric constants of X-cut single-crystal quartz, thin film ZnO, and nonpiezoelectric SiO2 thin films.
نوع الوثيقة: article in journal/newspaper
اللغة: English
DOI: 10.1063/1.122914
الاتاحة: http://dx.doi.org/10.1063/1.122914
https://pubs.aip.org/aip/apl/article-pdf/73/26/3851/18538818/3851_1_online.pdf
رقم الانضمام: edsbas.C99542AF
قاعدة البيانات: BASE