التفاصيل البيبلوغرافية
| العنوان: |
Progress in the micromagnetic multiparameter microstructure and stress analysis -3MA- ; Neue Fortschritte in der mikromagnetischen Vielparameter-Mikrostruktur- und -Spannungs-Analyse - 3MA |
| المؤلفون: |
Becker, R., Dobmann, G., Theiner, W.A. |
| سنة النشر: |
1989 |
| المجموعة: |
Publikationsdatenbank der Fraunhofer-Gesellschaft |
| مصطلحات موضوعية: |
Eigenspannung, indirekte Methode, magnetisches Verfahren, Materialkenngröße, Multiparameterregression, Zerstörungsfreie Prüfung |
| Time: |
620, 658, 670 |
| الوصف: |
S.516-523 ; Material characteristics such as hardness, yield-strength, ductility etc. can be controlled and designed for a given material in certain limits. For steels manufacturing parameters like the chemical composition, block- or continuous-casting, hot-rolling, forging, cold-rolling, heat-treatments, and machining influence the microstructure and residual stress state which in combination with additional load conditions during service (mechanical static/dynamic, thermal, corrosive) determine the material properties and behaviour. In mechanical- and technological tests (standard tensile, notch-impact, etc.) the service loads are simulated mainly under maximum load conditions in order to characterize the material fitness for service. 3 MA-techniques and their inspection quantities (Barkhausen-noise incremental permeability, eddy-current impedance spectroscopy, etc.) are also influenced by microstructure and stress in steels. The emphasis in the following contribution will be on the presentation of these facts with the goal to show correlation between material characteristics and 3 MA-quantities. |
| نوع الوثيقة: |
conference object |
| اللغة: |
English |
| Relation: |
International Symposium on Nondestructive Characterization of Materials 1988; Nondestructive Characterization of Materials III; https://publica.fraunhofer.de/handle/publica/316771 |
| الاتاحة: |
https://publica.fraunhofer.de/handle/publica/316771 |
| رقم الانضمام: |
edsbas.C52AE462 |
| قاعدة البيانات: |
BASE |