Academic Journal

Scanless laser waveform measurement in the near-infrared

التفاصيل البيبلوغرافية
العنوان: Scanless laser waveform measurement in the near-infrared
المؤلفون: Truong, Tran-Chau, Liu, Yangyang, Khatri, Dipendra, Zhang, Yuxuan, Shim, Bonggu, Chini, Michael
المساهمون: Basic Energy Sciences, Air Force Office of Scientific Research, Fusion Energy Sciences, National Science Foundation, IEEC of Binghamton University
المصدر: APL Photonics ; volume 10, issue 1 ; ISSN 2378-0967
بيانات النشر: AIP Publishing
سنة النشر: 2025
الوصف: Field-resolved measurements of few-cycle laser waveforms allow access to ultrafast electron dynamics in light–matter interactions and are key to future lightwave electronics. Recently, sub-cycle gating based on nonlinear excitation in active pixel sensors has allowed the first single-shot measurements of mid-infrared optical fields. Extending the techniques to shorter wavelengths, however, is not feasible using silicon-based detectors with bandgaps in the near-infrared. Here, we demonstrate an all-optical sampling technique for near-infrared laser fields, wherein an intense fundamental field generates a sub-cycle gate through nonlinear excitation of a wide-bandgap crystal, in this case, ZnO, which can sample the electric field of a weak perturbing pulse. By using a crossed-beam geometry, the temporal evolution of the perturbing field is mapped onto a transverse spatial axis of the nonlinear medium, and the waveform is captured in a single measurement of the spatially resolved fluorescence emission from the crystal. The technique is demonstrated through field-resolved measurements of the field reshaping during nonlinear propagation in the ZnO detection crystal.
نوع الوثيقة: article in journal/newspaper
اللغة: English
DOI: 10.1063/5.0239294
DOI: 10.1063/5.0239294/20331633/016101_1_5.0239294.pdf
الاتاحة: https://doi.org/10.1063/5.0239294
https://pubs.aip.org/aip/app/article-pdf/doi/10.1063/5.0239294/20331633/016101_1_5.0239294.pdf
Rights: https://creativecommons.org/licenses/by-nc/4.0/
رقم الانضمام: edsbas.C405831F
قاعدة البيانات: BASE