Analog testing using Zero-Crossing technique

التفاصيل البيبلوغرافية
العنوان:	Analog testing using Zero-Crossing technique
المؤلفون:	Seireg, R., Al Emadi, N., Abdel Naby, M., El Refaie, O.
بيانات النشر:	IEEE
المجموعة:	Qatar University: QU Institutional Repository
مصطلحات موضوعية:	Circuit faults, Circuit testing, Compaction, Computer science, Detectors, Educational institutions, Frequency, Military computing, System testing, Test pattern generators
الوصف:	The functional digital testing is defined as a black and white test according to N. Nagi et al.(1998) and B. Vinnakota(1998) by other words, it can determine faulty and non faulty boards. But the analog faults are not. The faulty and non-faulty are relatively defined depending on tolerance allowed for non-faulty boards. In this paper, we introduce a new universal method based on Zero-Crossing technique to evaluate the faulty circuits. The effect of tolerance from 0 to 20% in frequency and amplitude has been formulated. The simulation has been done by MATLAB. The results indicate the simplicity of the proposed method. ; Scopus
نوع الوثيقة:	conference object
وصف الملف:	application/pdf
اللغة:	English
Relation:	http://dx.doi.org/10.1109/ICM-02.2002.1161538; http://hdl.handle.net/10576/57615; 237-240; 2002-January
DOI:	10.1109/ICM-02.2002.1161538
الاتاحة:	http://hdl.handle.net/10576/57615 https://doi.org/10.1109/ICM-02.2002.1161538
رقم الانضمام:	edsbas.C35CBFD6
قاعدة البيانات:	BASE

الوصف
DOI:	10.1109/ICM-02.2002.1161538