Academic Journal
The evanescent-wave cavity ring-down spectroscopy technique applied to the investigation of thermally grown oxides on Si(100)
| العنوان: | The evanescent-wave cavity ring-down spectroscopy technique applied to the investigation of thermally grown oxides on Si(100) |
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| المؤلفون: | Cotirlan-Simioniuc, C., Ghita, R. V., Negrila, C. C., Logofatu, C. |
| المصدر: | Applied Physics A ; volume 117, issue 3, page 1359-1365 ; ISSN 0947-8396 1432-0630 |
| بيانات النشر: | Springer Science and Business Media LLC |
| سنة النشر: | 2014 |
| نوع الوثيقة: | article in journal/newspaper |
| اللغة: | English |
| DOI: | 10.1007/s00339-014-8556-3 |
| DOI: | 10.1007/s00339-014-8556-3.pdf |
| DOI: | 10.1007/s00339-014-8556-3/fulltext.html |
| الاتاحة: | http://dx.doi.org/10.1007/s00339-014-8556-3 http://link.springer.com/content/pdf/10.1007/s00339-014-8556-3.pdf http://link.springer.com/article/10.1007/s00339-014-8556-3/fulltext.html http://link.springer.com/content/pdf/10.1007/s00339-014-8556-3 |
| Rights: | http://www.springer.com/tdm |
| رقم الانضمام: | edsbas.C033B13 |
| قاعدة البيانات: | BASE |
| DOI: | 10.1007/s00339-014-8556-3 |
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