Academic Journal
Atomic resolution with high-eigenmode tapping mode atomic force microscopy
| العنوان: | Atomic resolution with high-eigenmode tapping mode atomic force microscopy |
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| المؤلفون: | Severin, N., Dzhanoev, A. R., Lin, H., Rauf, A., Kirstein, S., Palma, C.-A., Sokolov, I. M., Rabe, J. P. |
| المساهمون: | Deutsche Forschungsgemeinschaft, Alexander von Humboldt-Stiftung |
| المصدر: | Physical Review Research ; volume 4, issue 2 ; ISSN 2643-1564 |
| بيانات النشر: | American Physical Society (APS) |
| سنة النشر: | 2022 |
| نوع الوثيقة: | article in journal/newspaper |
| اللغة: | English |
| DOI: | 10.1103/physrevresearch.4.023149 |
| DOI: | 10.1103/PhysRevResearch.4.023149 |
| DOI: | 10.1103/PhysRevResearch.4.023149/fulltext |
| الاتاحة: | http://dx.doi.org/10.1103/physrevresearch.4.023149 https://link.aps.org/article/10.1103/PhysRevResearch.4.023149 http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevResearch.4.023149/fulltext |
| Rights: | https://creativecommons.org/licenses/by/4.0/ |
| رقم الانضمام: | edsbas.BD20C6ED |
| قاعدة البيانات: | BASE |
| DOI: | 10.1103/physrevresearch.4.023149 |
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