Conference
Two-dimensional dopant profile characterization for MCT and IGBT structures
| العنوان: | Two-dimensional dopant profile characterization for MCT and IGBT structures |
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| المؤلفون: | Dallmann, G., Feudel, T., Syhre, H., Lendenmann, H., Fichtner, W. |
| المصدر: | Proceedings of the 6th International Symposium on Power Semiconductor Devices and Ics ; volume 93 1, page 305-308 |
| بيانات النشر: | Hartung-Gorre Verlag |
| سنة النشر: | 2002 |
| نوع الوثيقة: | conference object |
| اللغة: | unknown |
| DOI: | 10.1109/ispsd.1994.583749 |
| الاتاحة: | http://dx.doi.org/10.1109/ispsd.1994.583749 http://xplorestaging.ieee.org/ielx2/4460/12642/00583749.pdf?arnumber=583749 |
| رقم الانضمام: | edsbas.B90511DD |
| قاعدة البيانات: | BASE |
| DOI: | 10.1109/ispsd.1994.583749 |
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