Academic Journal
Compensating Probe Misplacements in On-Wafer S-Parameters Measurements
| العنوان: | Compensating Probe Misplacements in On-Wafer S-Parameters Measurements |
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| المؤلفون: | Schmidt, Robin, Clochiatti, Simone, Mutlu, Enes, Weimann, Nils, Ferrero, Andrea, Dieudonne, Michael, Schreurs, Dominique M. M.-P. |
| المساهمون: | European Union’s Horizon 2020 Research and Innovation Program, TeraApps) |
| المصدر: | IEEE Transactions on Microwave Theory and Techniques ; volume 70, issue 11, page 5213-5223 ; ISSN 0018-9480 1557-9670 |
| بيانات النشر: | Institute of Electrical and Electronics Engineers (IEEE) |
| سنة النشر: | 2022 |
| نوع الوثيقة: | article in journal/newspaper |
| اللغة: | unknown |
| DOI: | 10.1109/tmtt.2022.3205606 |
| الاتاحة: | http://dx.doi.org/10.1109/tmtt.2022.3205606 http://xplorestaging.ieee.org/ielx7/22/9939120/09900436.pdf?arnumber=9900436 |
| Rights: | https://creativecommons.org/licenses/by/4.0/legalcode |
| رقم الانضمام: | edsbas.B67887D4 |
| قاعدة البيانات: | BASE |
| DOI: | 10.1109/tmtt.2022.3205606 |
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