InP Lattice-Matched HEMT with Regrown Source/Drain by MOCVD

التفاصيل البيبلوغرافية
العنوان: InP Lattice-Matched HEMT with Regrown Source/Drain by MOCVD
المؤلفون: Li, Qiang, Li, Ming, Tang, Chak Wah, Lau, Kei May
سنة النشر: 2011
المجموعة: The Hong Kong University of Science and Technology: HKUST Institutional Repository
مصطلحات موضوعية: Gate-length, InAlAs/InGaAs, InP, InP substrates, Lattice-matched, Layered Structures, Maximum oscillation frequency, RF performance
الوصف: In this paper, we report the incorporation of Source/Drain regrowth by MOCVD in InAlAs/InGaAs HEMT on InP substrate. Greatly improved RF performance of the device was observed, compared with standard HEMTs with the same layered structure. 1-μm gate-length device exhibits a 34% improvement of cutoff frequency fT and a 74% improvement of maximum oscillation frequency fmax. © VDE VERLAG GMBH.
نوع الوثيقة: conference object
اللغة: English
تدمد: 1092-8669
Relation: http://repository.ust.hk/ir/Record/1783.1-33254; International Conference on Indium Phosphide and Related Materials, Berlin, Germany, 2011, article number 5978339; http://www.scopus.com/record/display.url?eid=2-s2.0-84863288445&origin=inward
الاتاحة: http://repository.ust.hk/ir/Record/1783.1-33254
http://www.scopus.com/record/display.url?eid=2-s2.0-84863288445&origin=inward
رقم الانضمام: edsbas.B40D3843
قاعدة البيانات: BASE