Conference
Zero-energy SIMS: Towards quantitative depth profiling with high spatial and high depth resolution
| العنوان: | Zero-energy SIMS: Towards quantitative depth profiling with high spatial and high depth resolution |
|---|---|
| المؤلفون: | Vanhove, Nico, Lievens, Peter, Vandervorst, Wilfried |
| سنة النشر: | 2008 |
| المجموعة: | KU Leuven: Lirias |
| الوصف: | status: published |
| نوع الوثيقة: | conference object |
| اللغة: | English |
| Relation: | SIMS Europe: 6th European Workshop on Secondary Ion Mass Spectrometry. Book of Abstracts pages:p115; SIMS Europe: 6th European Workshop on Secondary Ion Mass Spectrometry. Book of Abstracts location:Münster Germany date:14-sep-2008; C16719; https://lirias.kuleuven.be/handle/123456789/303957 |
| الاتاحة: | https://lirias.kuleuven.be/handle/123456789/303957 |
| رقم الانضمام: | edsbas.B38C423F |
| قاعدة البيانات: | BASE |
| الوصف غير متاح. |