Academic Journal
Calibration of Scanning Electron Microscopes over a Wide Range of Magnifications
| العنوان: | Calibration of Scanning Electron Microscopes over a Wide Range of Magnifications |
|---|---|
| المؤلفون: | Kirtaev, R. V., Kuzin, A. Yu., Maslov, V. G., Mityukhlyaev, V. B., Todua, P. A., Filippov, M. N. |
| المصدر: | Measurement Techniques ; volume 59, issue 12, page 1245-1249 ; ISSN 0543-1972 1573-8906 |
| بيانات النشر: | Springer Science and Business Media LLC |
| سنة النشر: | 2017 |
| نوع الوثيقة: | article in journal/newspaper |
| اللغة: | English |
| DOI: | 10.1007/s11018-017-1123-5 |
| DOI: | 10.1007/s11018-017-1123-5/fulltext.html |
| DOI: | 10.1007/s11018-017-1123-5.pdf |
| الاتاحة: | http://dx.doi.org/10.1007/s11018-017-1123-5 http://link.springer.com/article/10.1007/s11018-017-1123-5/fulltext.html http://link.springer.com/content/pdf/10.1007/s11018-017-1123-5.pdf |
| Rights: | http://www.springer.com/tdm |
| رقم الانضمام: | edsbas.B2770219 |
| قاعدة البيانات: | BASE |
| DOI: | 10.1007/s11018-017-1123-5 |
|---|