Academic Journal
C ion-implanted TiO2 thin film for photocatalytic applications
| العنوان: | C ion-implanted TiO2 thin film for photocatalytic applications |
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| المؤلفون: | Impellizzeri, G., Scuderi, V., Romano, L., Napolitani, E., Sanz, R., Carles, Robert, Privitera, V. |
| المساهمون: | MATIS CNR-INFM Dipartimento di Metodologie Fisiche e Chimiche (DMFCI) (MATIS), Università degli studi di Catania = University of Catania (Unict)-Istituto Nazionale di Fisica Nucleare (INFN), Nano-Optique et Nanomatériaux pour l'optique (CEMES-NeO), Centre d'élaboration de matériaux et d'études structurales (CEMES), Institut National des Sciences Appliquées - Toulouse (INSA Toulouse), Institut National des Sciences Appliquées (INSA)-Université de Toulouse (UT)-Institut National des Sciences Appliquées (INSA)-Université de Toulouse (UT)-Institut de Chimie de Toulouse (ICT), Institut de Recherche pour le Développement (IRD)-Université Toulouse III - Paul Sabatier (UT3), Université de Toulouse (UT)-Université de Toulouse (UT)-Institut de Chimie - CNRS Chimie (INC-CNRS)-Centre National de la Recherche Scientifique (CNRS)-Institut National Polytechnique (Toulouse) (Toulouse INP), Université de Toulouse (UT)-Institut de Recherche pour le Développement (IRD)-Université Toulouse III - Paul Sabatier (UT3), Université de Toulouse (UT)-Institut de Chimie - CNRS Chimie (INC-CNRS)-Centre National de la Recherche Scientifique (CNRS)-Institut National Polytechnique (Toulouse) (Toulouse INP), Université de Toulouse (UT)-Centre National de la Recherche Scientifique (CNRS)-Institut National des Sciences Appliquées - Toulouse (INSA Toulouse), Université de Toulouse (UT)-Centre National de la Recherche Scientifique (CNRS) |
| المصدر: | ISSN: 0021-8979. |
| بيانات النشر: | HAL CCSD American Institute of Physics |
| سنة النشر: | 2015 |
| المجموعة: | Université Toulouse III - Paul Sabatier: HAL-UPS |
| مصطلحات موضوعية: | Energy gap, Heavy ions, Ions, Light, Mass spectrometry, Photodegradation, Rutherford backscattering spectroscopy, Secondary ion mass spectrometry, Semiconductor doping, Spectrometry, X ray diffraction, Degradation of organic compounds, Environmental applications, Luminescence spectroscopy, Optical characterization, Photocatalytic application, Rutherford back-scattering spectrometry, Structural investigation, Synthesized materials, Titanium dioxide, [PHYS]Physics [physics] |
| الوصف: | cited By 18 ; International audience ; Third-generation TiO2 photocatalysts were prepared by implantation of C+ ions into 110nm thick TiO2 films. An accurate structural investigation was performed by Rutherford backscattering spectrometry, secondary ion mass spectrometry, X-ray diffraction, Raman-luminescence spectroscopy, and UV/VIS optical characterization. The C doping locally modified the TiO2 pure films, lowering the band-gap energy from 3.3eV to a value of 1.8eV, making the material sensitive to visible light. The synthesized materials are photocatalytically active in the degradation of organic compounds in water under both UV and visible light irradiation, without the help of any additional thermal treatment. These results increase the understanding of the C-doped titanium dioxide, helpful for future environmental applications. |
| نوع الوثيقة: | article in journal/newspaper |
| اللغة: | English |
| Relation: | hal-01763598; https://hal.science/hal-01763598; https://hal.science/hal-01763598/document; https://hal.science/hal-01763598/file/1.4915111.pdf |
| DOI: | 10.1063/1.4915111 |
| الاتاحة: | https://hal.science/hal-01763598 https://hal.science/hal-01763598/document https://hal.science/hal-01763598/file/1.4915111.pdf https://doi.org/10.1063/1.4915111 |
| Rights: | info:eu-repo/semantics/OpenAccess |
| رقم الانضمام: | edsbas.B1008199 |
| قاعدة البيانات: | BASE |
| DOI: | 10.1063/1.4915111 |
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