Academic Journal
Comprehensive S/TEM Study of Interfaces in CVD Grown Vertical and In-plane Heterostructures of Two-Dimensional MoS 2 and ReS 2
| العنوان: | Comprehensive S/TEM Study of Interfaces in CVD Grown Vertical and In-plane Heterostructures of Two-Dimensional MoS 2 and ReS 2 |
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| المؤلفون: | Bachu, Saiphaneendra, Stanton, Lauren, Qian, Chenhao, Reifsnyder Hickey, Danielle, Alem, Nasim |
| المصدر: | Microscopy and Microanalysis ; volume 26, issue S2, page 1644-1646 ; ISSN 1431-9276 1435-8115 |
| بيانات النشر: | Oxford University Press (OUP) |
| سنة النشر: | 2020 |
| مصطلحات موضوعية: | Instrumentation |
| نوع الوثيقة: | article in journal/newspaper |
| اللغة: | English |
| DOI: | 10.1017/s1431927620018826 |
| الاتاحة: | http://dx.doi.org/10.1017/s1431927620018826 https://www.cambridge.org/core/services/aop-cambridge-core/content/view/S1431927620018826 |
| Rights: | https://www.cambridge.org/core/terms |
| رقم الانضمام: | edsbas.AEE04F9C |
| قاعدة البيانات: | BASE |
| DOI: | 10.1017/s1431927620018826 |
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