Academic Journal
Non-destructive and rapid evaluation of chemical vapor deposition graphene by dark field optical microscopy
| العنوان: | Non-destructive and rapid evaluation of chemical vapor deposition graphene by dark field optical microscopy |
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| المؤلفون: | Kong, X. H., Ji, H. X., Piner, R. D., Li, H. F., Magnuson, C. W., Tan, C., Ismach, A., Chou, H., Ruoff, R. S. |
| المصدر: | Applied Physics Letters ; volume 103, issue 4 ; ISSN 0003-6951 1077-3118 |
| بيانات النشر: | AIP Publishing |
| سنة النشر: | 2013 |
| الوصف: | Non-destructive and rapid evaluation of graphene directly on the growth substrate (Cu foils) by dark field (DF) optical microscopy is demonstrated. Without any additional treatment, graphene on Cu foils with various coverages can be quickly identified by DF imaging immediately after chemical vapor deposition growth with contrast comparable to scanning electron microscopy. The improved contrast of DF imaging compared to bright field optical imaging was found to be due to Rayleigh scattering of light by the copper steps beneath graphene. Indeed, graphene adlayers are readily distinguished, due to the different height of copper steps beneath graphene regions of different thickness. |
| نوع الوثيقة: | article in journal/newspaper |
| اللغة: | English |
| DOI: | 10.1063/1.4816752 |
| DOI: | 10.1063/1.4816752/14292279/043119_1_online.pdf |
| الاتاحة: | https://doi.org/10.1063/1.4816752 https://pubs.aip.org/aip/apl/article-pdf/doi/10.1063/1.4816752/14292279/043119_1_online.pdf |
| رقم الانضمام: | edsbas.AD83BE82 |
| قاعدة البيانات: | BASE |
| DOI: | 10.1063/1.4816752 |
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