Academic Journal
Hard-x-ray microscopy with Fresnel zone plates reaches 40 nm Rayleigh resolution
| العنوان: | Hard-x-ray microscopy with Fresnel zone plates reaches 40 nm Rayleigh resolution |
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| المؤلفون: | Chu, YS, Yi, JM, De Carlo, F, Shen, Q, Lee, WK, Wu, HJ, Wang, CL, Wang, JY, Liu, CJ, Wang, CH, Wu, SR, Chien, CC, Hwu, Y, Tkachuk, A, Yun, W, Feser, M, Liang, KS, Yang, CS, Je, JH, Margaritondo, G |
| المساهمون: | 신소재공학과, 10123980, Je, JH |
| بيانات النشر: | AMER INST PHYSICS |
| سنة النشر: | 2008 |
| المجموعة: | Pohang University of Science and Technology (POSTECH): Open Access System for Information Sharing (OASIS) |
| الوصف: | Substantial improvements in the nanofabrication and characteristics of gold Fresnel zone plates yielded unprecedented resolution levels in hard-x-ray microscopy. Tests performed on a variety of specimens with 8-10 keV photons demonstrated a first-order lateral resolution below 40 nm based on the Rayleigh criterion. Combined with the use of a phase contrast technique, this makes it possible to view features in the 30 nm range; good-quality images can be obtained at video rate, down to 50 ms/frame. The important repercussions on materials science, nanotechnology, and the life sciences are discussed. (C) 2008 American Institute of Physics. ; open ; 1 ; 1 ; 148 ; 161 ; scie ; scopus |
| نوع الوثيقة: | article in journal/newspaper |
| اللغة: | English |
| تدمد: | 0003-6951 |
| Relation: | APPLIED PHYSICS LETTERS; 92; 10; SCI급, SCOPUS 등재논문; SCI; Physics, Applied; Physics; 2015-OAK-0000007588; https://oasis.postech.ac.kr/handle/2014.oak/9641; 8277; APPLIED PHYSICS LETTERS, v.92, no.10; 000253989300119; 2-s2.0-40849114948 |
| DOI: | 10.1063/1.2857476 |
| الاتاحة: | https://oasis.postech.ac.kr/handle/2014.oak/9641 https://doi.org/10.1063/1.2857476 |
| Rights: | BY_NC_ND ; http://creativecommons.org/licenses/by-nc-nd/2.0/kr |
| رقم الانضمام: | edsbas.AD0881B0 |
| قاعدة البيانات: | BASE |
| تدمد: | 00036951 |
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| DOI: | 10.1063/1.2857476 |