Academic Journal

Intelligent Vulnerability Analysis for Connectivity and Critical-Area Integrity in IoV

التفاصيل البيبلوغرافية
العنوان: Intelligent Vulnerability Analysis for Connectivity and Critical-Area Integrity in IoV
المؤلفون: Liu, Shumei, Yu, Yao, Hu, Wenjian, Peng, Yuhuai, Yang, Xiaolong
المساهمون: National Basic Research Program of China, National Natural Science Foundation of China, Fundamental Research Funds for the Central Universities, Visiting Scholar Program of the China Scholarship Council
المصدر: IEEE Access ; volume 8, page 114239-114248 ; ISSN 2169-3536
بيانات النشر: Institute of Electrical and Electronics Engineers (IEEE)
سنة النشر: 2020
نوع الوثيقة: article in journal/newspaper
اللغة: unknown
DOI: 10.1109/access.2020.3003808
الاتاحة: http://dx.doi.org/10.1109/access.2020.3003808
http://xplorestaging.ieee.org/ielx7/6287639/8948470/09121236.pdf?arnumber=9121236
Rights: https://creativecommons.org/licenses/by/4.0/legalcode
رقم الانضمام: edsbas.A95C4CD
قاعدة البيانات: BASE
الوصف
DOI:10.1109/access.2020.3003808