Academic Journal

Saturation of Open‐Circuit Voltage at Higher Light Intensity Caused by Interfacial Defects and Nonradiative Recombination Losses in Perovskite Solar Cells

التفاصيل البيبلوغرافية
العنوان: Saturation of Open‐Circuit Voltage at Higher Light Intensity Caused by Interfacial Defects and Nonradiative Recombination Losses in Perovskite Solar Cells
المؤلفون: Ompong, David, Ram, Kiran Sreedhar, Setsoafia, Daniel Dodzi Yao, Mehdizadeh Rad, Hooman, Singh, Jai
المصدر: Advanced Materials Interfaces ; volume 10, issue 1 ; ISSN 2196-7350 2196-7350
بيانات النشر: Wiley
سنة النشر: 2022
المجموعة: Wiley Online Library (Open Access Articles via Crossref)
الوصف: A new analytical expression that directly relates the open‐circuit voltage ( V oc ) in perovskite solar cells (PSCs) to the quasi‐Fermi level splitting (QFLS), interface energy offsets, and nonradiative recombination losses has been derived. It is found that the QFLS of the active layer plays a dominant role in enhancing V oc of PSCs. The newly derived V oc is applied to two PSCs with the hole transport layer (HTL) of poly[bis(4‐phenyl)(2,4,6‐trimethylphenyl)amine], and poly(3‐hexylthiophene‐2,5‐diyl) (P3HT) and found that the first PSC has a higher V oc , which agrees well with the experimental results. It is found that both PSCs exhibit saturation of V oc at the higher charge carrier generation rates and hence at higher light intensities. The lower V oc in PSC with P3HT as HTL is attributed to the stronger band bending and higher interfacial defects. In accordance with the results, a large quasi‐Fermi level splitting and a minimal interfacial energy offsets may be considered when selecting material for high V oc PSCs.
نوع الوثيقة: article in journal/newspaper
اللغة: English
DOI: 10.1002/admi.202201578
الاتاحة: http://dx.doi.org/10.1002/admi.202201578
https://onlinelibrary.wiley.com/doi/pdf/10.1002/admi.202201578
https://onlinelibrary.wiley.com/doi/full-xml/10.1002/admi.202201578
Rights: http://creativecommons.org/licenses/by/4.0/
رقم الانضمام: edsbas.A81F33CE
قاعدة البيانات: BASE