Academic Journal
The dependence of surface morphology on the growth temperature of the Pb 0.7 Sn 0.3 Te/Si(111) topological insulator thin films
العنوان: | The dependence of surface morphology on the growth temperature of the Pb 0.7 Sn 0.3 Te/Si(111) topological insulator thin films |
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المؤلفون: | Kaveev, A K, Bondarenko, D N, Tereshchenko, O E |
المصدر: | Journal of Physics: Conference Series ; volume 2103, issue 1, page 012086 ; ISSN 1742-6588 1742-6596 |
بيانات النشر: | IOP Publishing |
سنة النشر: | 2021 |
الوصف: | The possibility of epitaxial growth of Pb 0.7 Sn 0.3 Te crystalline topological insulator films on the Si(111) surface was shown and epitaxial relations were found. It was shown that, depending on the growth temperature, it is possible to control not only the character of the morphology, but also, to a significant extent, the smoothness of the epitaxial layer surface, which is extremely important for further transport measurements of the films. Analysis of the grown films surface morphology made it possible to establish the average value of the height and lateral size of the terraces and islands forming Pb 0.7 Sn 0.3 Te surface. |
نوع الوثيقة: | article in journal/newspaper |
اللغة: | unknown |
DOI: | 10.1088/1742-6596/2103/1/012086 |
DOI: | 10.1088/1742-6596/2103/1/012086/pdf |
الاتاحة: | http://dx.doi.org/10.1088/1742-6596/2103/1/012086 https://iopscience.iop.org/article/10.1088/1742-6596/2103/1/012086 https://iopscience.iop.org/article/10.1088/1742-6596/2103/1/012086/pdf |
Rights: | http://creativecommons.org/licenses/by/3.0/ ; https://iopscience.iop.org/info/page/text-and-data-mining |
رقم الانضمام: | edsbas.A3E35AEC |
قاعدة البيانات: | BASE |
DOI: | 10.1088/1742-6596/2103/1/012086 |
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