Academic Journal
Comprehensive Studies on the Carrier Transporting Property and Photo-Bias Instability of Sputtered Zinc Tin Oxide Thin Film Transistors
| العنوان: | Comprehensive Studies on the Carrier Transporting Property and Photo-Bias Instability of Sputtered Zinc Tin Oxide Thin Film Transistors |
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| المؤلفون: | Hong Woo Lee, Bong Seob Yang, Yoon Jang Kim, Ah Young Hwang, Seungha Oh, Jong Hwan Lee, Jae Kyeong Jeong, Hyeong Joon Kim |
| المساهمون: | Industrial Strategic Technology Development Program through the Ministry of Knowledge and Economy/Korea Evaluation Institute of Industrial Technology |
| المصدر: | IEEE Transactions on Electron Devices ; volume 61, issue 9, page 3191-3198 ; ISSN 0018-9383 1557-9646 |
| بيانات النشر: | Institute of Electrical and Electronics Engineers (IEEE) |
| سنة النشر: | 2014 |
| نوع الوثيقة: | article in journal/newspaper |
| اللغة: | unknown |
| DOI: | 10.1109/ted.2014.2337307 |
| الاتاحة: | http://dx.doi.org/10.1109/ted.2014.2337307 http://xplorestaging.ieee.org/ielx7/16/6880431/06862886.pdf?arnumber=6862886 |
| Rights: | https://ieeexplore.ieee.org/Xplorehelp/downloads/license-information/IEEE.html |
| رقم الانضمام: | edsbas.A1E6BEDB |
| قاعدة البيانات: | BASE |
| DOI: | 10.1109/ted.2014.2337307 |
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