Academic Journal
A new phase-correlation-based Iris matching for degraded images
العنوان: | A new phase-correlation-based Iris matching for degraded images |
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المؤلفون: | Krichen, Emine, Garcia-Salicetti, Sonia, Dorizzi, Bernadette |
المساهمون: | Département Electronique et Physique (TSP - EPH), Institut Mines-Télécom Paris (IMT)-Télécom SudParis (TSP) |
المصدر: | ISSN: 1083-4419 ; EISSN: 1941-0492. |
بيانات النشر: | HAL CCSD Institute of Electrical and Electronics Engineers |
سنة النشر: | 2009 |
المجموعة: | Archive ouverte HAL (Hyper Article en Ligne, CCSD - Centre pour la Communication Scientifique Directe) |
مصطلحات موضوعية: | Iris verification, Local and global correlation-based method, Degraded iris images, Gabor phase, [INFO.INFO-CR]Computer Science [cs]/Cryptography and Security [cs.CR] |
الوصف: | International audience ; In this paper, we present a new phase correlation-based iris matching approach in order to deal with degradations in iris images due to unconstrained acquisition procedures. Our matching system is a fusion of global and local Gabor phase correlation schemes. The main originality of our local approach is that we do not only consider the correlation peak amplitudes but also their locations in different regions of the images. Results on several degraded databases namely CASIA-BIOSECURE and Iris Challenge Evaluation 2005 databases, show the improvement of our method compared to two available Reference Systems, MASEK and OSIRIS, in verification mode |
نوع الوثيقة: | article in journal/newspaper |
اللغة: | English |
Relation: | hal-00472598; https://hal.science/hal-00472598; https://hal.science/hal-00472598/document; https://hal.science/hal-00472598/file/Krichen-SMCB.pdf |
DOI: | 10.1109/TSMCB.2008.2009770 |
الاتاحة: | https://hal.science/hal-00472598 https://hal.science/hal-00472598/document https://hal.science/hal-00472598/file/Krichen-SMCB.pdf https://doi.org/10.1109/TSMCB.2008.2009770 |
Rights: | info:eu-repo/semantics/OpenAccess |
رقم الانضمام: | edsbas.9AF203EC |
قاعدة البيانات: | BASE |
DOI: | 10.1109/TSMCB.2008.2009770 |
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