Academic Journal
From small angle x-ray scattering to reflectivity: Instrumentation and sample study
| العنوان: | From small angle x-ray scattering to reflectivity: Instrumentation and sample study |
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| المؤلفون: | Hua, D. W., Beaucage, G., Kent, M. S. |
| المصدر: | Journal of Materials Research ; volume 11, issue 2, page 273-276 ; ISSN 0884-2914 2044-5326 |
| بيانات النشر: | Springer Science and Business Media LLC |
| سنة النشر: | 1996 |
| الوصف: | In this study, we described the first results from an x-ray reflectometer which has been modified from an existing Kratky small angle x-ray scattering (SAXS) camera at the UNM/Sandia scattering center. Typically, seven orders of magnitude of reflectivity can be obtained over a range of 0.02 to 0.5 Å −1 in q . This allows the resolution of surface features of 10 to 1000 Å. The conversion to reflectometer is reversible and can be achieved in a short time, allowing for dual use of an existing Kratky camera. |
| نوع الوثيقة: | article in journal/newspaper |
| اللغة: | English |
| DOI: | 10.1557/jmr.1996.0031 |
| الاتاحة: | http://dx.doi.org/10.1557/jmr.1996.0031 https://www.cambridge.org/core/services/aop-cambridge-core/content/view/S0884291400022275 |
| Rights: | https://www.cambridge.org/core/terms |
| رقم الانضمام: | edsbas.8C7536E2 |
| قاعدة البيانات: | BASE |
| DOI: | 10.1557/jmr.1996.0031 |
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