Academic Journal
Electromigration: Investigation of heterogeneous systems
| العنوان: | Electromigration: Investigation of heterogeneous systems |
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| المؤلفون: | Vanhecke, B., De Schepper, L., De Ceuninck, W., D'Haeger, V., D'Olieslaegers, M., Beyne, E., Roggen, J., Stals, L. |
| المصدر: | Microelectronics Reliability ; volume 33, issue 8, page 1141-1157 ; ISSN 0026-2714 |
| بيانات النشر: | Elsevier BV |
| سنة النشر: | 1993 |
| المجموعة: | ScienceDirect (Elsevier - Open Access Articles via Crossref) |
| نوع الوثيقة: | article in journal/newspaper |
| اللغة: | English |
| DOI: | 10.1016/0026-2714(93)90344-x |
| الاتاحة: | http://dx.doi.org/10.1016/0026-2714(93)90344-x https://api.elsevier.com/content/article/PII:002627149390344X?httpAccept=text/xml https://api.elsevier.com/content/article/PII:002627149390344X?httpAccept=text/plain |
| Rights: | https://www.elsevier.com/tdm/userlicense/1.0/ |
| رقم الانضمام: | edsbas.87512DEC |
| قاعدة البيانات: | BASE |
| DOI: | 10.1016/0026-2714(93)90344-x |
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