التفاصيل البيبلوغرافية
| العنوان: |
Elektronová mikroskopie, mikroanalýza a difrakce na ÚMCH AV ČR |
| المؤلفون: |
Šlouf, M. (Miroslav), Pavlova, E. (Ewa), Králová, D. (Daniela), Hromádková, J. (Jiřina), Vlková, H. (Helena), Lapčíková, M. (Monika) |
| سنة النشر: |
2010 |
| المجموعة: |
The Czech Academy of Sciences: Publication Activity (ASEP) / Akademie věd ČR - Publikační činnost |
| مصطلحات موضوعية: |
introduction to electron microscopy, electron spectroscopy, electron diffraction |
| الوصف: |
The contribution describes application of electron microscopy on microcrystals and nanocrystals. It deals with the following modes of scanning (SEM) and transmission electron microscopy (TEM): SEM/SE (secondary electrons imaging in SEM), TEM/BF (bright field imaging in TEM) SEM/EDX, TEM/EDX (energy dispersive analysis of X-rays in SEM and TEM), TEM/SAED (selected area electron diffraction in TEM). |
| نوع الوثيقة: |
article in journal/newspaper |
| اللغة: |
Czech |
| Relation: |
http://hdl.handle.net/11104/0186363 |
| الاتاحة: |
http://hdl.handle.net/11104/0186363 |
| رقم الانضمام: |
edsbas.8023EC4 |
| قاعدة البيانات: |
BASE |