Academic Journal
TCAD investigation on hot-electron injection in new-generation technologies
| العنوان: | TCAD investigation on hot-electron injection in new-generation technologies |
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| المؤلفون: | Reggiani, S., Rossetti, M., Gnudi, A., Tallarico, A.N., Molfese, A., Manzini, S., Depetro, R., Croce, G., Sangiorgi, E., Fiegna, C. |
| المساهمون: | ECSEL, H2020-EU ECSEL |
| المصدر: | Microelectronics Reliability ; volume 88-90, page 1090-1093 ; ISSN 0026-2714 |
| بيانات النشر: | Elsevier BV |
| سنة النشر: | 2018 |
| المجموعة: | ScienceDirect (Elsevier - Open Access Articles via Crossref) |
| نوع الوثيقة: | article in journal/newspaper |
| اللغة: | English |
| DOI: | 10.1016/j.microrel.2018.07.097 |
| الاتاحة: | http://dx.doi.org/10.1016/j.microrel.2018.07.097 https://api.elsevier.com/content/article/PII:S0026271418306590?httpAccept=text/xml https://api.elsevier.com/content/article/PII:S0026271418306590?httpAccept=text/plain |
| Rights: | https://www.elsevier.com/tdm/userlicense/1.0/ |
| رقم الانضمام: | edsbas.7D9711AC |
| قاعدة البيانات: | BASE |
| DOI: | 10.1016/j.microrel.2018.07.097 |
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