Conference
Electrical characterisation and reliability studies of thick film gas sensor structures
| العنوان: | Electrical characterisation and reliability studies of thick film gas sensor structures |
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| المؤلفون: | Czech, I., Manea, J., Roggen, J., Huyberechts, G., Stals, L., De Schepper, L. |
| المصدر: | Proceedings of International Conference on Microelectronic Test Structures ; page 99-103 |
| بيانات النشر: | IEEE |
| سنة النشر: | 2002 |
| نوع الوثيقة: | conference object |
| اللغة: | unknown |
| DOI: | 10.1109/icmts.1996.535628 |
| الاتاحة: | http://dx.doi.org/10.1109/icmts.1996.535628 http://xplorestaging.ieee.org/ielx3/3839/11206/00535628.pdf?arnumber=535628 |
| رقم الانضمام: | edsbas.7BF65CD5 |
| قاعدة البيانات: | BASE |
| DOI: | 10.1109/icmts.1996.535628 |
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