Conference
Test engineering education in Europe: the EuNICE-Test project
| العنوان: | Test engineering education in Europe: the EuNICE-Test project |
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| المؤلفون: | Bertrand Y., Flottes M. L, Balado L., Figueras J., Biasizzo A., Novak F., Pricopi N., Wunderlich H. J., Van Der Heyden J. P., DI CARLO, STEFANO, PRINETTO, Paolo Ernesto |
| المساهمون: | Bertrand, Y., Flottes, M. L., Balado, L., Figueras, J., Biasizzo, A., Novak, F., DI CARLO, Stefano, Prinetto, Paolo Ernesto, Pricopi, N., Wunderlich, H. J., Van Der Heyden, J. P. |
| بيانات النشر: | IEEE USA Washington D.C. |
| سنة النشر: | 2003 |
| المجموعة: | PORTO@iris (Publications Open Repository TOrino - Politecnico di Torino) |
| مصطلحات موضوعية: | DIGITAL SYSTEM DESIGN TEST AND VERIFICATION, Continuing education, Engineering education, Industrial training, Microelectronic, Test facilitie, Testing |
| الوصف: | The paper deals with a European experience of education in industrial test of ICs and SoCs using remote testing facilities. The project addresses the problem of the shortage in microelectronics engineers aware with the new challenge of testing mixed-signal SoCs far multimedia/telecom market. It aims at providing test training facilities at a European scale in both initial and continuing education contexts. This is done by allowing the academic and industrial partners of the consortium to train engineers using the common test resources center (CRTC) hosted by LIRMM (Laboratoire d'Informatique, de Robotique et de Microelectronique de Montpellier, France). CRTC test tools include up-to-date/high-tech testers that are fully representative of real industrial testers as used on production testfloors. At the end of the project, it is aimed at reaching a cruising speed of about 16 trainees per year per center. Each trainee will have attend at least one one-week training using the remote test facilities of CRTC. |
| نوع الوثيقة: | conference object |
| وصف الملف: | STAMPA |
| اللغة: | English |
| Relation: | info:eu-repo/semantics/altIdentifier/isbn/0769519733; info:eu-repo/semantics/altIdentifier/wos/WOS:000183433900039; ispartofbook:Titolo volume non avvalorato; IEEE International Conference on Microelectronic Systems Education (ICMSE); firstpage:85; lastpage:86; numberofpages:2; http://hdl.handle.net/11583/1499946; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-21444443748; http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=1205266 |
| DOI: | 10.1109/MSE.2003.1205266 |
| الاتاحة: | http://hdl.handle.net/11583/1499946 https://doi.org/10.1109/MSE.2003.1205266 http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=1205266 |
| Rights: | info:eu-repo/semantics/openAccess |
| رقم الانضمام: | edsbas.730FA580 |
| قاعدة البيانات: | BASE |
| DOI: | 10.1109/MSE.2003.1205266 |
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