Academic Journal
The presence of C/ω-V and G/ω-V peaks profile of Ag/SnO2/n-Si/Au MOS junction for capacitor applications
| العنوان: | The presence of C/ω-V and G/ω-V peaks profile of Ag/SnO2/n-Si/Au MOS junction for capacitor applications |
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| المؤلفون: | Benhaliliba, M., Benouis, C.E., Aldemir, D. Ali |
| المصدر: | Physica B: Condensed Matter ; volume 572, page 175-183 ; ISSN 0921-4526 |
| بيانات النشر: | Elsevier BV |
| سنة النشر: | 2019 |
| المجموعة: | ScienceDirect (Elsevier - Open Access Articles via Crossref) |
| نوع الوثيقة: | article in journal/newspaper |
| اللغة: | English |
| DOI: | 10.1016/j.physb.2019.07.043 |
| الاتاحة: | http://dx.doi.org/10.1016/j.physb.2019.07.043 https://api.elsevier.com/content/article/PII:S0921452619304843?httpAccept=text/xml https://api.elsevier.com/content/article/PII:S0921452619304843?httpAccept=text/plain |
| Rights: | https://www.elsevier.com/tdm/userlicense/1.0/ |
| رقم الانضمام: | edsbas.68C77AE9 |
| قاعدة البيانات: | BASE |
| DOI: | 10.1016/j.physb.2019.07.043 |
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