Academic Journal

Subthreshold Swing in Silicon Gate-All-Around Nanowire and Fully Depleted SOI MOSFETs at Cryogenic Temperature

التفاصيل البيبلوغرافية
العنوان: Subthreshold Swing in Silicon Gate-All-Around Nanowire and Fully Depleted SOI MOSFETs at Cryogenic Temperature
المؤلفون: Sekiguchi, Shohei, Ahn, Min-Ju, Mizutani, Tomoko, Saraya, Takuya, Kobayashi, Masaharu, Hiramoto, Toshiro
المساهمون: Japan Society for the Promotion of Science (JSPS) KAKENHI
المصدر: IEEE Journal of the Electron Devices Society ; volume 9, page 1151-1154 ; ISSN 2168-6734
بيانات النشر: Institute of Electrical and Electronics Engineers (IEEE)
سنة النشر: 2021
نوع الوثيقة: article in journal/newspaper
اللغة: unknown
DOI: 10.1109/jeds.2021.3108854
الاتاحة: http://dx.doi.org/10.1109/jeds.2021.3108854
http://xplorestaging.ieee.org/ielx7/6245494/9359727/09525143.pdf?arnumber=9525143
Rights: https://creativecommons.org/licenses/by/4.0/legalcode ; https://creativecommons.org/licenses/by/4.0/legalcode
رقم الانضمام: edsbas.6625622A
قاعدة البيانات: BASE
الوصف
DOI:10.1109/jeds.2021.3108854